@article{article, title = {{Quantifying the nature of hot carrier degradation in the Spacer Region of LDD n MOSFETs}}, url = {{}}, year = {{2001}}, month = {{1}}, author = {{Manhas SK and De Souza MM and Oates AS}}, volume = {{1}}, journal = {{IEEE Transactions on Devices and Materials Reliability}}, pages = {{134}}, note = {{Accessed on 2025/05/25}}}