TY - CONF T1 - Metamorphic testing with causal graphs JO - 2023 IEEE Conference on Software Testing, Verification and Validation (ICST) UR - https://eprints.whiterose.ac.uk/id/eprint/195317 PY - 2023/05/26 AU - Clark AG AU - Foster M AU - Walkinshaw N AU - Hierons RM ED - DO - DOI: 10.1109/ICST57152.2023.00023 PB - Institute of Electrical and Electronics Engineers (IEEE) SN - 9781665456678 Y2 - 2025/05/19 ER -