@inproceedings{inproceedings, title = {{Single Event Effects in Power MOSFETs and SRAMs Due to 3 MeV, 14 MeV and Fission Neutrons}}, publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}}, url = {{http://dx.doi.org/10.1109/tns.2011.2106142 }}, year = {{2011}}, month = {{2}}, author = {{Hands A and Morris P and Dyer C and Ryden K and Truscott P}}, doi = {{10.1109/tns.2011.2106142}}, volume = {{58}}, journal = {{IEEE Transactions on Nuclear Science}}, issue = {{3}}, pages = {{952-959}}, note = {{Accessed on 2025/05/21}}}