TY - JOUR T1 - Common path michelson interferometer based on multiple reflections within the sample arm: Sensor applications and imaging artefacts JO - Measurement Science and Technology PY - 2011/01/01 AU - Krstaji膰 N AU - Childs D AU - Smallwood R AU - Hogg R AU - Matcher SJ ED - DO - DOI: 10.1088/0957-0233/22/2/027002 VL - 22 IS - 2 Y2 - 2025/05/18 ER -