TY - JOUR T1 - Inspection of Enamel Removal Using Infrared Thermal Imaging and Machine Learning Techniques JO - Sensors UR - http://dx.doi.org/10.3390/s23083977 PY - 2023/04/14 AU - Tiwari D AU - Miller D AU - Farnsworth M AU - Lambourne A AU - Jewell GW AU - Tiwari A ED - DO - DOI: 10.3390/s23083977 PB - MDPI AG VL - 23 IS - 8 SP - 3977 EP - 3977 Y2 - 2025/05/29 ER -