TY - JOUR T1 - Two-trap model for carrier lifetime and resistivity behavior in partially annealedGaAsgrown at low temperature JO - Physical Review B PY - 2006/01/01 AU - Gregory IS AU - Tey CM AU - Cullis AG AU - Evans MJ AU - Beere HE AU - Farrer I ED - DO - DOI: 10.1103/physrevb.73.195201 PB - American Physical Society (APS) VL - 73 IS - 19 Y2 - 2025/05/24 ER -