@article{article, title = {{Knowledge-Enhanced Spatiotemporal Analysis for Anomaly Detection in Process Manufacturing}},
publisher = {{Elsevier BV}},
url = {{http://dx.doi.org/10.1016/j.compind.2024.104111 }},
year = {{2024}},
month = {{10}},
author = {{Allen L and Lu H and Cordiner J}},
doi = {{10.1016/j.compind.2024.104111}},
volume = {{161}},
journal = {{Computers in Industry}},
pages = {{104111-104111}},
note = {{Accessed on 2025/05/18}}}