TY - JOUR T1 - An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors JO - Journal of Physics: Conference Series PY - 2010/01/01 AU - Walther T ED - DO - DOI: 10.1088/1742-6596/241/1/012016 VL - 241 Y2 - 2025/05/31 ER -