TY - CONF T1 - Influence of a shallow p+ offset region on a novel edge termination technique using lightly doped p-rings JO - Proceedings of the International Semiconductor Conference, CAS PY - 1999/01/01 AU - Bose SCJV AU - De Souza MM AU - Narayanan EMS AU - Spulber O AU - Sweet M ED - VL - 1 SP - 63 EP - 66 Y2 - 2025/05/22 ER -